4. Smart Automated Test Equipment (ATE) For IoT Devices

For the testing challenges of tomorrow, traditional automated test equipment (ATE) falls short, according to National Instruments. Test engineers need smart ATE for the smart devices of the IoT.

Traditional automated test equipment used the power of Moore’s law — mostly digital, increasing transistor count, decreasing footprint — but now there's a shift to integrate more analog technology into integrated circuits (ICs), which is a challenge for equipment testers.

Instead, IoT has forced test engineers to verify mixed-signal systems that include both digital signals and analog signals from sensors.

Partner Takeaway: System builders will see a transition in automated test equipment for applications like wafer testing for SoCs.